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METHOD FOR DEFECT DETECTION SYSTEM FOR DEFECT DETECTION AND TRAINING METHOD THEREFOR

机译:缺陷检测系统的缺陷检测和训练方法的方法

摘要

A method of detecting one or more defects in an image on a display panel, the method comprising: receiving the image of the display panel; dividing the image into a plurality of patches; generating a plurality of feature vectors for the plurality of patches; and classifying each of the plurality of patches based on each of the plurality of feature vectors using a multi-class support vector machine to detect the one or more defects, wherein each of the plurality of patches is m pixels xn corresponding to a pixel region (m and n being integers greater than or equal to 1), each of the plurality of feature vectors corresponding to each of the plurality of patches, and including one or more image texture features and one or more image moment features .
机译:一种在显示面板上的图像中检测一个或多个缺陷的方法,该方法包括:接收显示面板的图像; 将图像划分为多个贴片; 为多个贴片产生多个特征向量; 并基于使用多级支持向量机器检测一个或多个缺陷的多个特征向量中的每一个来分类多个特征向量中的每一个,其中多个补丁中的每一个是对应于像素区域的m个像素xn( m和n是大于或等于1的整数,每个特征向量中的每一个对应于多个补丁中的每一个,包括一个或多个图像纹理特征和一个或多个图像矩特征。

著录项

  • 公开/公告号KR102281106B1

    专利类型

  • 公开/公告日2021-07-23

    原文格式PDF

  • 申请/专利权人 삼성디스플레이 주식회사;

    申请/专利号KR20180037656

  • 发明设计人 이장환;장 이웨이;

    申请日2018-03-30

  • 分类号G01N21/88;G06N99;G06T7;

  • 国家 KR

  • 入库时间 2022-08-24 20:25:06

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