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DEFECT DETECTION METHOD, SYSTEM FOR DEFECT DETECTION, AND TRAINING METHOD
DEFECT DETECTION METHOD, SYSTEM FOR DEFECT DETECTION, AND TRAINING METHOD
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机译:缺陷检测方法,缺陷检测系统和训练方法
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摘要
PROBLEM TO BE SOLVED: To provide a system for defect detection and a defect detection method using the system.SOLUTION: A method for detecting one or more defects in an image of a display panel includes the steps of receiving the image of the display panel, dividing the image into a plurality of patches, generating a plurality of feature vectors for the plurality of patches, and classifying each one of the plurality of patches on the basis of each of the plurality of feature vectors by utilizing a multi-class support vector machine (SVM) to detect the one or more defects. Each of the plurality of patches corresponding to an area of an m pixel by n pixel of the image (where m and n are integers greater than or equal to one). Each of the plurality of feature vectors corresponds to each of the plurality of patches and includes one or more image texture features and one or more image moment features.SELECTED DRAWING: Figure 2
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