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DEFECT DETECTION METHOD, SYSTEM FOR DEFECT DETECTION, AND TRAINING METHOD

机译:缺陷检测方法,缺陷检测系统和训练方法

摘要

PROBLEM TO BE SOLVED: To provide a system for defect detection and a defect detection method using the system.SOLUTION: A method for detecting one or more defects in an image of a display panel includes the steps of receiving the image of the display panel, dividing the image into a plurality of patches, generating a plurality of feature vectors for the plurality of patches, and classifying each one of the plurality of patches on the basis of each of the plurality of feature vectors by utilizing a multi-class support vector machine (SVM) to detect the one or more defects. Each of the plurality of patches corresponding to an area of an m pixel by n pixel of the image (where m and n are integers greater than or equal to one). Each of the plurality of feature vectors corresponds to each of the plurality of patches and includes one or more image texture features and one or more image moment features.SELECTED DRAWING: Figure 2
机译:解决的问题:提供一种用于缺陷检测的系统和使用该系统的缺陷检测方法。解决方案:一种用于检测显示面板的图像中的一个或多个缺陷的方法,包括以下步骤:接收显示面板的图像,将图像划分为多个小块,为多个小块生成多个特征向量,并通过使用多类支持向量机,基于多个特征向量中的每一个,对多个小块中的每一个进行分类(SVM)来检测一个或多个缺陷。多个补丁中的每个补丁对应于图像的m像素乘n像素的区域(其中m和n是大于或等于1的整数)。多个特征向量中的每一个对应于多个补丁中的每一个,并且包括一个或多个图像纹理特征和一个或多个图像矩特征。

著录项

  • 公开/公告号JP2018180545A

    专利类型

  • 公开/公告日2018-11-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG DISPLAY CO LTD;

    申请/专利号JP20180079940

  • 发明设计人 LEE JANGHWAN;ZHANG YIWEI;

    申请日2018-04-18

  • 分类号G09F9;G06T7;G06T7/66;G06T7/45;

  • 国家 JP

  • 入库时间 2022-08-21 12:22:30

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