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SUPERCONDUCTOR CRITICAL TEMPERATURE MEASUREMENT

机译:超导体临界温度测量

摘要

A system for measuring critical temperatures of superconducting components of a superconducting circuit housed in a cryogenic chamber with a controllable ambient temperature is described. The superconducting circuit can have a plurality of superconductor-resistor pairs connected in series. Each of the plurality of superconductor-resistor pairs can include a superconducting component and a resistor coupled in parallel with the superconducting component. The system can also include a resistance meter that measures a resistance of the superconducting circuit. The system further includes a controller that commands the cryogenic chamber to gradually sweep the ambient temperature. The controller can also record an instant ambient temperature as a critical temperature for a given superconducting component of a corresponding one of the plurality of superconductor-resistor pairs in response to detecting a change in a measured resistance across an input node and an output node of the superconducting circuit.
机译:描述了一种用于测量容纳在低温室中的超导电路的超导部件的临界温度的系统描述于具有可控环境温度。超导电路可以具有串联连接的多个超导电阻器对。多个超导体电阻器对中的每一个可包括超导组件和与超导部件平行耦合的电阻器。该系统还可以包括测量超导电路的电阻的电阻表。该系统还包括控制低温室以逐渐扫描环境温度的控制器。控制器还可以将瞬时环境温度作为响应于检测到输入节点的测量电阻和输出节点的测量电阻中的变化和输出节点中的多个超导体电阻器对中的对应超导组件的临界温度。超导电路。

著录项

  • 公开/公告号EP3847432A1

    专利类型

  • 公开/公告日2021-07-14

    原文格式PDF

  • 申请/专利权人 NORTHROP GRUMMAN SYSTEMS CORPORATION;

    申请/专利号EP20190758542

  • 发明设计人 GRANINGER AURELIUS L.;

    申请日2019-07-31

  • 分类号G01K7/16;G01N27/02;G01R27/04;G01N25/12;

  • 国家 EP

  • 入库时间 2022-08-24 19:55:32

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