首页> 外国专利> METHODS FOR FORMING A GERMANIUM ISLAND USING SELECTIVE EPITAXIAL GROWTH AND A SACRIFICIAL FILLING LAYER

METHODS FOR FORMING A GERMANIUM ISLAND USING SELECTIVE EPITAXIAL GROWTH AND A SACRIFICIAL FILLING LAYER

机译:使用选择性外延生长和牺牲填充层形成锗岛的方法

摘要

A method for obtaining a semiconductor island includes epitaxially growing a semiconductor structure over a substrate having a mask layer defining an area not covered by the mask layer. The semiconductor structure includes a first portion positioned adjacent to the mask layer and a second portion positioned away from the mask layer. The first portion has a first height that is less than a second height of a portion of the mask layer positioned adjacent the first portion. The second portion has a third height that is equal to or greater than the second height. The method also includes forming a fill layer over at least the first portion; and subsequently removing at least a portion of the semiconductor structure located above the second height. A device fabricated by this method is also disclosed.
机译:获得半导体岛的方法包括在具有限定未被掩模层覆盖的区域的掩模层的基板上外延生长半导体结构。半导体结构包括与掩模层相邻定位的第一部分,并且第二部分定位远离掩模层。第一部分的第一高度小于邻近第一部分定位的掩模层的一部分的第二高度的第一高度。第二部分具有等于或大于第二高度的第三高度。该方法还包括在至少第一部分上形成填充层;随后去除位于第二高度上方的半导体结构的至少一部分。还公开了一种由该方法制造的装置。

著录项

  • 公开/公告号KR20210073511A

    专利类型

  • 公开/公告日2021-06-18

    原文格式PDF

  • 申请/专利权人 주식회사 스트라티오코리아;

    申请/专利号KR1020217003829

  • 发明设计人 이제형;나율;김영식;

    申请日2018-11-09

  • 分类号H01L21/02;H01L21/8234;H01L21/8258;H01L27/088;

  • 国家 KR

  • 入库时间 2022-08-24 19:49:26

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