首页> 外国专利> NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD OF THE NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD OF THE NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

机译:非易失性半导体存储器件和非易失性半导体存储器件的制造方法

摘要

A certain embodiment includes: first wiring layers extended in a first direction and arranged in a second direction; second wiring layers provided above the first wiring layer of a third direction and arranged in the first direction and extended in the second direction; first stacked structures comprising a first memory cell disposed between the second and first wiring layers at a crossing portion between the second and first wiring layers; first conductive layers provided in the same layer as the first wiring layers, adjacent to the first wiring layer in the second direction, and not connected to other than the second wiring layer; second stacked structures disposed at crossing portions between the second wiring layers and the first conductive layers; and an insulation layer provided between the first stacked structures and between the second stacked structures having a Young's modulus larger than that of the insulation layer.
机译:某个实施例包括:第一布线层在第一方向上延伸并沿第二方向布置;第二布线层设置在第三方向的第一布线层上方并且沿第一方向布置并在第二方向上延伸;第一堆叠结构包括设置在第二和第一布线层之间的交叉部分的第二和第一布线层之间的第一存储器单元;第一导电层设置在与第一布线层相同的层中,在第二方向上与第一布线层相邻,并且不连接到除第二布线层之外;第二堆叠结构设置在第二布线层和第一导电层之间的交叉部分处;并且在第一堆叠结构之间提供的绝缘层,并且在具有大于绝缘层的杨氏模量的第二堆叠结构之间。

著录项

  • 公开/公告号US2021202580A1

    专利类型

  • 公开/公告日2021-07-01

    原文格式PDF

  • 申请/专利权人 KIOXIA CORPORATION;

    申请/专利号US202117203172

  • 发明设计人 KOTARO NODA;

    申请日2021-03-16

  • 分类号H01L27/24;H01L45;H01L23;

  • 国家 US

  • 入库时间 2022-08-24 19:41:54

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