首页> 外国专利> Semi-insulating silicon carbide crystalline ingot having a resistivity larger than 10∧7 Ohm-cm and manufacturing method therefor

Semi-insulating silicon carbide crystalline ingot having a resistivity larger than 10∧7 Ohm-cm and manufacturing method therefor

机译:半绝缘碳化硅结晶锭的电阻率大于10-7欧姆-cm和制造方法

摘要

A silicon carbide crystal and a manufacturing method thereof are provided. The silicon carbide crystal includes an N-type seed layer, a barrier layer, and a semi-insulating ingot, which are sequentially stacked and are made of silicon carbide. The N-type seed layer has a resistivity within a range of 0.01-0.03 Ω·cm. The barrier layer includes a plurality of epitaxial layers sequentially formed on the N-type seed layer by an epitaxial process. The C/Si ratios of the epitaxial layers gradually increase in a growth direction away from the N-type seed layer. A nitrogen concentration of the silicon carbide crystal gradually decreases from the N-type seed layer toward the semi-insulating ingot by a diffusion phenomenon, so that the semi-insulating crystal has a resistivity larger than 107 Ω·cm.
机译:提供了一种碳化硅晶体及其制造方法。碳化硅晶体包括n型种子层,阻挡层和半绝缘锭,其依次堆叠并由碳化硅制成。 n型种子层的电阻率在0.01-0.03Ω·cm的范围内。阻挡层包括通过外延工艺在n型种子层上顺序地形成的多个外延层。外延层的C / Si比率逐渐增加生长方向远离N型种子层。通过扩散现象,碳化硅晶体的氮浓度逐渐从n型种子层朝向半绝缘铸锭逐渐减小,从而半绝缘晶体的电阻率大于10 7 ω ·厘米。

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