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SURFACE ANALYSIS METHOD, SURFACE ANALYSIS SYSTEM, AND SURFACE ANALYSIS PROGRAM

机译:表面分析方法,表面分析系统和表面分析计划

摘要

A surface analysis method according to one embodiment comprises: a step for acquiring a force curve based on a measurement of a sample surface by means of a scanning-type probe microscope provided with a probe; a step for calculating a differential curve by first-order-differentiating the force curve by a probe-surface distance that is the distance between the probe and the surface; a step for calculating, on the basis of the differential curve, the distance from the sample surface to the farthest peak as a breaking length of an organic material forming the sample surface; and a step for outputting the breaking length.
机译:根据一个实施方案的表面分析方法包括:通过扫描型探针显微镜进行样品表面的测量来获取力曲线的步骤;通过首级分化力曲线通过探针和表面之间的距离来计算差分曲线的步骤;基于差曲线计算的步骤,从样品表面到最远峰值的距离,作为形成样品表面的有机材料的断裂长度;以及输出断裂长度的步骤。

著录项

  • 公开/公告号WO2021117203A1

    专利类型

  • 公开/公告日2021-06-17

    原文格式PDF

  • 申请/专利权人 SHOWA DENKO MATERIALS CO. LTD.;

    申请/专利号WO2019JP48822

  • 发明设计人 ARAI YUKI;

    申请日2019-12-12

  • 分类号G01Q60/28;

  • 国家 JP

  • 入库时间 2022-08-24 19:27:09

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