首页> 外国专利> ANALYSIS ELEMENT CHIP FOR SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS, SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS DEVICE FOR ANALYZING SPECIMEN BY USING THE ANALYSIS ELEMENT CHIP, AND SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS METHOD

ANALYSIS ELEMENT CHIP FOR SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS, SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS DEVICE FOR ANALYZING SPECIMEN BY USING THE ANALYSIS ELEMENT CHIP, AND SURFACE PLASMON RESONANCE FLUORESCENCE ANALYSIS METHOD

机译:用于表面等离子体共振荧光分析的分析元素芯片,用于使用标本芯片分析标本的表面等离子体共振荧光分析设备和表面等离子体共振荧光分析方法

摘要

PROBLEM TO BE SOLVED: To provide an analysis element chip for surface plasmon resonance fluorescence analysis which is capable of providing an accurate incident angle of a light beam on a predetermined surface of a prism in which an electric field for exciting a fluorescent material contained in a specimen becomes the maximum, and to provide a surface plasmon resonance fluorescence analysis device for analyzing a specimen by using the analysis element chip, and a surface plasmon resonance fluorescence analysis method.;SOLUTION: An analysis element chip 20 which includes a prism 21 having a metal thin film 25 formed on a predetermined surface 23 and in which information 35 about an incident angle 5 of light on the predetermined surface 23 in the prism 21 is stored, is prepared. The light is emitted to the prism 21 so as to enter the predetermined surface 23 at the incident angle 5 based on the information 35 stored in the analysis element chip 20.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种用于表面等离振子共振荧光分析的分析元件芯片,其能够提供光束在棱镜的预定表面上的准确入射角,在该棱镜的预定表面上,电场激发包含在其中的荧光材料。样品变为最大,并提供一种用于通过使用分析元件芯片来分析样品的表面等离子体共振荧光分析装置以及一种表面等离子体共振荧光分析方法。解决方案:分析元件芯片20包括具有棱镜21的棱镜21。制备形成在预定表面23上的金属薄膜25,并在其中存储有关光在棱镜21中的预定表面23上的入射角5的信息35。基于存储在分析元件芯片20中的信息35,光以入射角5入射到棱镜21,以进入预定表面23。COPYRIGHT:(C)2012,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号