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Method for manufacturing silicon carbide substrate, method for manufacturing silicon carbide epitaxial substrate, and method for manufacturing silicon carbide semiconductor device

机译:制造碳化硅衬底的制造方法,制造碳化硅外延基板的方法,以及制造碳化硅半导体器件的方法

摘要

A silicon carbide ingot is cut using a wire. The silicon carbide ingot has a polytype of 4H—SiC. The silicon carbide ingot includes a top surface, a bottom surface opposite to the top surface, and a side surface between the top surface and the bottom surface. A direction from the bottom surface toward the top surface is a direction parallel to a [0001] direction or a direction inclined by less than or equal to 8° relative to the [0001] direction. In the cutting of the silicon carbide ingot, the silicon carbide ingot is cut from the side surface at a (000-1) plane side along a straight line parallel to a direction within ±5° relative to a direction that bisects an angle formed by a [1-100] direction and a [11-20] direction when viewed in the direction from the bottom surface toward the top surface.
机译:使用电线切割碳化硅锭。碳化硅锭的4H-SiC的聚型。碳化硅锭包括顶表面,与顶表面相对的底表面,以及顶表面和底表面之间的侧表面。从底表面朝向顶表面的方向是平行于V方向的方向或相对于高于或等于8°的方向的方向。在碳化硅锭的切割中,沿着(000-1)平面侧的侧表面沿平行于±5°内的方向的直线切割碳化硅锭,相对于按平坦的角度当在从底表面朝向顶表面观察时,[1-100]方向和[11-20]方向。

著录项

  • 公开/公告号US11034058B2

    专利类型

  • 公开/公告日2021-06-15

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC INDUSTRIES LTD.;

    申请/专利号US201716078089

  • 发明设计人 NAOKI MATSUMOTO;KYOKO OKITA;

    申请日2017-01-26

  • 分类号H01L21/02;B28D5/04;C30B25/20;C30B25/18;C30B29/36;H01L29/16;

  • 国家 US

  • 入库时间 2022-08-24 19:20:12

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