首页> 外国专利> Semiconductor device design verification support device, semiconductor device design verification support program, and semiconductor device design verification support method

Semiconductor device design verification support device, semiconductor device design verification support program, and semiconductor device design verification support method

机译:半导体器件设计验证支持设备,半导体器件设计验证支持程序,以及半导体器件设计验证支持方法

摘要

A design verification support apparatus includes, a memory that stores circuit information and test pattern information, and a processor coupled to the memory. The processor performs a process including, acquiring the circuit information and the test pattern information from the memory, calculating a delay time occurring until the first clock signal reaches each of a plurality of memory circuits coupled in series and included in the scan chain from the clock source, based on the circuit information, selecting a first memory circuit whose first output value is to be changed by a shift operation among the plurality of memory circuits, based on the test pattern information at the cycle, and calculating the first output value of the first memory circuit when a second clock signal is supplied to the first memory circuit, the second clock signal being obtained by delaying the first clock signal by a delay time.
机译:设计验证支持设备包括存储电路信息和测试模式信息的存储器,以及耦合到存储器的处理器。处理器执行包括从存储器获取电路信息和测试模式信息的过程,计算出在第一时钟信号达到串联耦合的多个存储电路中的每个存储电路中的每一个并包括在来自时钟的扫描链中的每个的延迟时间基于电路信息,基于在循环处的测试模式信息,选择通过多个存储电路中的换档操作来改变第一存储电路的第一存储电路,并计算第一个输出值第一存储器电路当第二时钟信号被提供给第一存储电路时,通过延迟延迟时间来获得第二时钟信号。

著录项

  • 公开/公告号JP6880403B2

    专利类型

  • 公开/公告日2021-06-02

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20170102507

  • 发明设计人 菅原 修;

    申请日2017-05-24

  • 分类号G06F30/33;G01R31/28;H01L21/82;H01L21/822;H01L27/04;G06F30/3312;

  • 国家 JP

  • 入库时间 2022-08-24 19:11:24

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