The present invention refers to a method for improving the quality/integrity of an EBSD/TKD map (30) that is comprising a plurality of data points (31, 32), wherein each data point (31, 32) is assigned to a corresponding grid point of a sample grid and represents crystal information based on a Kikuchi pattern (20) detected for the grid point. The method of the invention comprises the steps of: determining a defective data point (31) of the EBSD/TKD map (30) and a plurality of non-defective neighboring data points (32, 33) of the defective data point (31), comparing the position of Kikuchi bands (21) of a Kikuchi pattern (20) detected for a grid point corresponding to the defective data point (31) with the positions of bands in at least one simulated Kikuchi pattern corresponding to crystal information of the neighboring data points (32, 33), and assigning the defective data point (31) the crystal information of one of the plurality of neighboring data point (32, 33) based on the comparison. The invention further relates to a method for determining a sample structure and a measurement system.
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