首页> 外国专利> PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE PACKAGE SUBSTRATE, AND SEMICONDUCTOR PACKAGE INCLUDING THE PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE

PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE PACKAGE SUBSTRATE, AND SEMICONDUCTOR PACKAGE INCLUDING THE PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE

机译:封装基板和制造封装基板的方法,以及包括封装基板的半导体封装和制造半导体封装的方法

摘要

A package substrate may include first conductive patterns, a first insulation layer and a second insulation layer. The first conductive patterns may be electrically connected with a semiconductor chip. The first insulation layer may be on an upper surface and side surfaces of each of the first conductive patterns. The first insulation layer may include at least one opening under at least one of side surfaces of the semiconductor chip. The second insulation layer may be on a lower surface of each of the first conductive patterns. Thus, a gas generated from the DAF may be readily discharged through the opening. A spreading of a crack, which may be generated at the interface between the side surface of the semiconductor chip and the molding member, toward the conductive patterns of the package substrate may be limited and/or suppressed. Adhesion between the semiconductor chip and the molding member may be reinforced.
机译:封装基板可包括第一导电图案,第一绝缘层和第二绝缘层。第一导电图案可以与半导体芯片电连接。第一绝缘层可以位于每个第一导电图案的上表面和侧表面上。第一绝缘层可以包括在半导体芯片的侧表面中的至少一个下的至少一个开口。第二绝缘层可以位于每个第一导电图案的下表面上。因此,从DAF产生的气体可以通过开口容易地排出。可以限制和/或抑制可以限制和/或抑制在封装基板的导电图案的半导体芯片和模制构件的界面之间产生的裂缝的扩散。可以加强半导体芯片和模制构件之间的粘附性。

著录项

  • 公开/公告号US2021118790A1

    专利类型

  • 公开/公告日2021-04-22

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US202016863392

  • 发明设计人 KEUNHO CHOI;

    申请日2020-04-30

  • 分类号H01L23/498;H01L23/13;H01L23/31;H01L21/48;H01L21/56;

  • 国家 US

  • 入库时间 2024-06-14 21:27:14

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