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PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE PACKAGE SUBSTRATE, AND SEMICONDUCTOR PACKAGE INCLUDING THE PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE
PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE PACKAGE SUBSTRATE, AND SEMICONDUCTOR PACKAGE INCLUDING THE PACKAGE SUBSTRATE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE
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机译:封装基板和制造封装基板的方法,以及包括封装基板的半导体封装和制造半导体封装的方法
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摘要
A package substrate may include first conductive patterns, a first insulation layer and a second insulation layer. The first conductive patterns may be electrically connected with a semiconductor chip. The first insulation layer may be on an upper surface and side surfaces of each of the first conductive patterns. The first insulation layer may include at least one opening under at least one of side surfaces of the semiconductor chip. The second insulation layer may be on a lower surface of each of the first conductive patterns. Thus, a gas generated from the DAF may be readily discharged through the opening. A spreading of a crack, which may be generated at the interface between the side surface of the semiconductor chip and the molding member, toward the conductive patterns of the package substrate may be limited and/or suppressed. Adhesion between the semiconductor chip and the molding member may be reinforced.
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