首页> 外国专利> SUBSTRATE WITH MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY, REFLECTIVE MASK FOR EUV LITHOGRAPHY, METHOD FOR PRODUCING REFLECTIVE MASK FOR EUV LITHOGRAPHY, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SUBSTRATE WITH MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY, REFLECTIVE MASK FOR EUV LITHOGRAPHY, METHOD FOR PRODUCING REFLECTIVE MASK FOR EUV LITHOGRAPHY, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

机译:具有多层反射膜的基板,用于EUV光刻的反射掩模坯料,用于EUV光刻的反射掩模,用于EUV光刻的反射掩模的方法,以及制造半导体器件的方法

摘要

An object of the present invention is to provide a substrate with a multilayer reflective film that provides a reflective mask having high reflectance and excellent cleaning resistance. The present invention provides a substrate 12, a multilayer reflective film 14 formed on the substrate 12, in which a plurality of layers containing Si as a high refractive index material and a layer containing a low refractive index material are periodically stacked, It has a Ru-based protective film 16 formed on the multilayer reflective film 14 to protect the multilayer reflective film 14, and the surface layer of the multilayer reflective film 14 on the opposite side of the substrate is a layer containing the Si, and , The Ru-based protective film 16 contains a Ru compound containing Ru and Ti, and the Ru compound is a substrate provided with a multilayer reflective film containing more Ru than RuTi having a stoichiometric composition.
机译:本发明的一个目的是提供一种具有多层反射膜的基板,其提供具有高反射率和优异的清洁性的反射掩模。本发明提供了一种基板12,形成在基板12上的多层反射膜14,其中,作为高折射率材料的多个包含Si的层,并且周期性地堆叠含有低折射率材料的层,它具有Ru基于多层反射膜14上形成的保护膜16以保护多层反射膜14,并且在基板的相对侧的多层反射膜14的表面层是含有Si的层,并且基于Ru基保护膜16含有含Ru和Ti的Ru化合物,Ru化合物是设置有多层反射膜的基板,其含有比具有化学计量组成的ruti的Ru的多层反射膜。

著录项

  • 公开/公告号KR102239726B1

    专利类型

  • 公开/公告日2021-04-12

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020167001965

  • 发明设计人 오노우에 다까히로;

    申请日2014-09-09

  • 分类号G03F1/24;G03F1/22;G03F1/48;G03F7/20;

  • 国家 KR

  • 入库时间 2022-08-24 18:10:18

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