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Memory cell sensing based on precharging an access line using a sense amplifier

机译:基于预充电使用读出放大器的存储器单元感测

摘要

Methods, systems, and devices for operating a memory device are described. A sense amplifier may be used to precharge an access line to increase the reliability of the sensing operation. The access line may then charge share with the memory cell and a capacitor, which may be a reference capacitor, which may result in high-level states and low-level states on the access line. By precharging the access line with the sense amplifier and implementing charge sharing between the access line and a capacitor, the resulting high-level state and the low-level states on the access line may account for any offset voltage associated with the sense amplifier.
机译:描述用于操作存储器件的方法,系统和设备。读出放大器可用于预充电接入线以提高感测操作的可靠性。然后,接入线可以与存储器单元和电容器充电,电容器可以是参考电容,这可能导致接入线上的高级状态和低电平状态。通过将接入线预充电,具有读出放大器并在接入线和电容器之间实现电荷共享,所得到的高电平状态和接入线上的低电平状态可以解释与读出放大器相关联的任何偏移电压。

著录项

  • 公开/公告号US10957383B2

    专利类型

  • 公开/公告日2021-03-23

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US202016871495

  • 发明设计人 DANIELE VIMERCATI;

    申请日2020-05-11

  • 分类号G11C11/40;G11C11/4091;G11C11/408;G11C11/22;

  • 国家 US

  • 入库时间 2022-08-24 17:50:29

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