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Manufacturing method of laminated structure, manufacturing method of semiconductor device, and laminated structure

机译:层压结构的制造方法,半导体器件制造方法和层压结构

摘要

Problem to be solved: to provide a semiconductor device having a low cost at a low cost and a low cost semiconductor device having excellent electrical characteristics such as breakdown voltage characteristics.Solution: semiconductor layer 1 having first major surface 2 and second major surfaceThe first conductive layer 3 on the first main surface side andA method of manufacturing a laminated structure 10 comprising a second conductive layer 5 on the second main surface side;Mist CVD methodA semiconductor layer is grown on the substrateObtaining a laminate including a substrate and a semiconductor layer;Removing the substrate from the laminate andForming a first conductive layer on the first major surface of the semiconductor layer andForming a second conductive layer on the second main surface side of the semiconductor layer.A substrate containing mainly crystalline. Beta. - Ga2O3 as a semiconductor layer is grown using a substrate mainly containing lithium tantalate as the substrate.Diagram
机译:要解决的问题:提供一种以低成本的低成本的半导体器件和具有优异电气特性的低成本半导体器件,例如击穿电压特性。溶液:半导体层1在第一主表面侧具有第一主表面2和第二主表面2和第二主表面的第一导电层3,以及制造层叠结构10的方法,包括在第二主表面侧的第二导电层5;雾CVD方法半导体层在基础上生长在包括基板和半导体层的层压板上;从层叠体和形成半导体层的第一主表面上的第一导电层,在半导体层的第二主表面侧形成第二导电层的第一导电层,使基板与半导体层的第二导电层一起去除第一导电层。含有主要结晶的底物。 β。 - Ga2O3作为半导体层的使用主要含有钽酸锂作为底物的衬底生长

著录项

  • 公开/公告号JP2021040054A

    专利类型

  • 公开/公告日2021-03-11

    原文格式PDF

  • 申请/专利权人 信越化学工業株式会社;

    申请/专利号JP20190160726

  • 发明设计人 渡部 武紀;橋上 洋;坂爪 崇寛;

    申请日2019-09-03

  • 分类号H01L21/365;H01L29/872;H01L21/329;H01L29/24;H01L21/368;C23C16/01;C23C16/40;C30B29/16;

  • 国家 JP

  • 入库时间 2022-08-24 17:40:01

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