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Method for evaluating the SEB resistance and device for evaluating the SEB resistance
Method for evaluating the SEB resistance and device for evaluating the SEB resistance
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机译:评估SEB电阻和用于评估SEB电阻的装置的方法
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摘要
A method for evaluating SEB resistivity comprises: placing an excitation source (26) within a model of a semiconductor device; and determining an energy of the excitation source (26) at which the semiconductor device exhibits thermal runaway while a voltage of the semiconductor device applied to the model and the energy of the excitation source (26) are varied.
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