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method for the manufacture of a layer eigenleitenden galliumarsenids in a body from n - senior gallium arsenide

机译:n-高级砷化镓制备人体中的特征层砷化镓的方法

摘要

1,142,095. Semi-conductor devices. STANDARD TELEPHONES & CABLES Ltd. 11 Jan., 1968 [13 Jan., 1967], No. 1851/67. Heading H1K. A method of producing an " intrinsic " [semi-insulating] region in an N-type GaAs body comprises diffusing-in oxygen through an oxygen permeable surface layer. The surface layer may be silica and it is stated that oxygen does not convert areas not covered with the oxygen permeable layer. In a first embodiment a PIN diode is pro duced by depositing a layer (3) of silica Fig. 1a (not shown), on the surface of an N-type epitaxial layer 1 on an N + type GaAs substrate 2, and diffusing oxygen through the silica layer to form an intrinsic layer 4, Fig. 1b (not shown). The oxygen is preferably supplied in the form of water vapour. A P+type layer is then produced in the semi-insulating layer 4 by evaporating-on a layer 5 of gold containing zinc at an elevated temperature on to the layer 4, quickly cooling, and evaporating-on a layer 6 of gold at a lower temperature, Fig. 1c (not shown). The electrode is then electroless plated with a layer 7 of nickel followed by a thin layer 8 of gold, Fig. 1d (not shown). The body is cut into mesa diodes, Fig. 1e, which are lightly etched and mounted in individual housings, Fig. 1f (not shown). In a second embodiment, planar type PIN diodes are produced by depositing a layer of silica, removing part of the layer using a photo-resist technique to leave islands, Fig. 2a (not shown), and covering the surface and islands with a second silica layer of equal thickness, Fig. 2b (not shown). Oxygen is then diffused into the body and penetrates to a greater depth in the areas between the islands than in the areas under the islands, Fig. 2c (not shown), so that the breakdown voltage of each diode is determined by the parts of the intrinsic layer under the islands. P + type regions are produced on these thinner parts of the intrinsic layer by the method used in the first embodiment. The body is then cut into individual devices, Fig. 2d (not shown), which are lightly etched and mounted in housings with the electrodes on the P+type regions in contact with copper studs which form heat sinks, Fig. 2e (not shown).
机译:1,142,095。半导体器件。标准电话和电缆有限公司1968年1月11日[1967年1月13日],第1851/67号。标题H1K。在N型GaAs体中产生“本征” [半绝缘]区域的方法包括通过可渗透氧的表面层扩散氧。该表面层可以是二氧化硅,并且可以说氧不转化未被氧可渗透层覆盖的区域。在第一实施例中,通过在N +型GaAs衬底2上的N型外延层1的表面上沉积图1a的二氧化硅层(3)(未示出)来制造PIN二极管。通过二氧化硅层形成本征层4,图1b(未示出)。氧气优选以水蒸气的形式供应。然后,通过在高温下将含锌的金的金层5蒸发到层4上,快速冷却并在50℃的金层6上蒸发,在半绝缘层4中产生P +型层。较低的温度,图1c(未显示)。然后将电极化学镀镍层7,然后是金薄层8(图1d)(未显示)。主体被切成台面二极管(图1e),这些二极管被轻蚀刻并安装在图1f(未显示)的各个外壳中。在第二实施例中,通过沉积二氧化硅层,使用光致抗蚀剂技术去除该层的一部分以留下岛(图2a(未示出))并用第二层覆盖表面和岛来制造平面型PIN二极管。等厚的二氧化硅层,图2b(未显示)。然后,氧气扩散到体内,并在岛之间的区域中渗透的深度比岛下区域中的渗透深度大(图2c(未显示)),因此每个二极管的击穿电压由二极管的部分确定。岛下的本征层。通过在第一实施例中使用的方法,在本征层的这些较薄部分上产生P +型区域。然后将主体切成图2d的单个器件(未显示),将其轻蚀刻并安装在外壳中,使P +型区域上的电极与形成散热片的铜螺柱接触(图2e)(未显示) )。

著录项

  • 公开/公告号DE000001719507A

    专利类型

  • 公开/公告日1971-06-03

    原文格式PDF

  • 申请/专利权人 ITT IND GMBH DEUTSCHE;

    申请/专利号DE1719507A

  • 发明设计人 RICHARD ANTELL GEORG;

    申请日1968-01-11

  • 分类号B01J;

  • 国家 DE

  • 入库时间 2022-08-23 09:43:59

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