Manufacturing Methods and Technology Engineering High Efficiency,High Power Gallium Arsenide Read-Type IMPATT Diodes.

摘要

The X-band and Ku-band confirmatory sample wafers were processed into dice and evaluated. The confirmatory sample diodes were assembled and tested. Group B testing is being performed on the diodes. Installation and characterization of the thermal resistance testing equipment was completed. The noise measuring equipment was also completed and installed. The fifth operating life test was completed for the Ku-band diodes only. Priority for testing of X-band diodes was assigned to the confirmatory samples, delaying start of the fifth X-band life test. (Author)