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DEVICE FOR TWO-DIMENSIONAL ANALYSIS OF WEISSENBERG PHOTOGRAMS BY MEANS OF WEISSENBERG LATTICES

机译:用魏森伯格晶格二维分析魏森伯格照相的装置

摘要

1331191 Plotting Weissenberg photograms FREIBERGER PR€ZISIONSMECHANIK VEB 4 Jan 1971 293/71 Heading G1M The apparatus is for two dimensional analysis of X ray reflections in Weissenberg photograms by means of Weissenberg lattices in the examination of crystals. An illuminated stationery frame 1 carries an adjustable transparent plate 2 on which a Weissenberg lattice 3 is traced in blue colour. A frame 4 slidable on guide rails 10 carries a frame 6 hinged at 5 and supporting an adjustable plate 8 having a Weissenberg lattice 9 thereon in red colour. The frame 1 carries a hinged clip 15 to support an analysed Weissenberg photogram (not shown) which may be sandwiched between the lattice 3 and the movable lattice 9 so that the centre lines 11, 12 coincide when the frame 6 is hinged downwardly. In this sandwich position and by appropriate sliding movement of the frame 4 the systems of curves of the lattices 3 and 9 intersect, the frame 4 and 6 are then fixed by screw 14 and catches 16 so that the plotting of the photogram can begin.
机译:1331191绘制魏森伯格摄影图FREIBERGER PR€ZISIONSMECHANIK VEB 1971年1月4日293/71标题G1M该设备用于通过魏森伯格晶格检查晶体中魏森​​伯格摄影图中X射线反射的二维分析。照明的文具框架1上装有可调节的透明板2,在其上刻有蓝色的魏森伯格格子3。可在导轨10上滑动的框架4带有框架6,该框架6铰接在5处并支撑可调节板8,该可调节板8上具有红色的魏森伯格格子9。框架1带有铰链夹15,以支撑分析的魏森伯格摄影图(未示出),该摄影图可以被夹在格子3和可移动格子9之间,使得当框架6向下铰链时中心线11、12重合。在该夹层位置并且通过框架4的适当滑动,格子3和9的弯曲系统相交,然后框架4和6通过螺钉14和钩子16固定,从而可以开始摄影图的绘制。

著录项

  • 公开/公告号GB1331191A

    专利类型

  • 公开/公告日1973-09-26

    原文格式PDF

  • 申请/专利权人 FREIBERGER PRAEZISIONSMECHANIK VEB;

    申请/专利号GBD1331191

  • 发明设计人

    申请日1971-01-04

  • 分类号G01B5/20;

  • 国家 GB

  • 入库时间 2022-08-23 06:34:52

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