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Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording medium

机译:二维晶格校准装置,二维晶格校准方法,二维晶格校准程序和记录介质

摘要

A two-dimensional lattice calibrating device includes: a measuring unit that measures respective positions of marks for each of a plurality of measurement dispositions; a simultaneous-equations generating unit that generates simultaneous equations for acquiring deviations of the plurality of marks using a coordinate relational equation and a least-squares conditional equation that sets least-squares lines that minimize the deviation of actual position of the marks based on measurement values as coordinate axes of artifact coordinates; and a simultaneous-equations calculating unit that solves the derived simultaneous equations.
机译:一种二维晶格校准装置,包括:测量单元,其针对多个测量布置中的每一个测量标记的各自位置;以及同时方程式生成单元,其使用坐标关系方程式和最小二乘法条件方程式生成用于获取多个标记的偏差的同时方程式,该条件方程式设置基于测量值将标记的实际位置的偏差最小化的最小二乘法线作为伪影坐标的坐标轴;以及求解导出的联立方程的联立方程计算单元。

著录项

  • 公开/公告号US7765079B2

    专利类型

  • 公开/公告日2010-07-27

    原文格式PDF

  • 申请/专利权人 MASAYUKI NARA;MAKOTO ABBE;

    申请/专利号US20080153573

  • 发明设计人 MAKOTO ABBE;MASAYUKI NARA;

    申请日2008-05-21

  • 分类号G01P21/00;

  • 国家 US

  • 入库时间 2022-08-21 18:49:56

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