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MAGNETIC CORE CIRCUIT FOR TESTING ELECTRICAL SHORT CIRCUITS BETWEEN LEADS OF A MULTI-LEAD CIRCUIT PACKAGE
MAGNETIC CORE CIRCUIT FOR TESTING ELECTRICAL SHORT CIRCUITS BETWEEN LEADS OF A MULTI-LEAD CIRCUIT PACKAGE
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机译:磁芯电路,用于测试多引线电路封装的引线之间的电气短路
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摘要
A voltage is induced in at least one lead of a multi-lead package for an electronic circuit by one or more excitation cores disposed around one or more leads of the package. The leads are connected together at one end by the lead frame. The opposite ends of the leads are secured to a housing for the electronic circuit. One or more detection cores, disposed around one or more leads of the package and suitably spaced from the excitation cores, detect current in the lead circuit encompassed by the excitation and detection cores. A relatively high voltage is induced in the detection cores if a short circuit exists in the encompassed lead circuit while a relatively low voltage is induced in the detection cores if an open circuit is detected.
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