首页>
外国专利>
INFRARED TECHNIQUE FOR MEASURING A PARAMETER EG THICKNESS OF A THIN FILM
INFRARED TECHNIQUE FOR MEASURING A PARAMETER EG THICKNESS OF A THIN FILM
展开▼
机译:红外技术用于测量薄膜的参数EG厚度
展开▼
页面导航
摘要
著录项
相似文献
摘要
1348979 Photoelectric reflection and transmission measurements INFRA SYSTEMS Inc 5 Nov 1970 [5 Nov 1969] 34973/73 Divided out of 1348978 Heading G1A The Specification 1348978 describes and claims that aspect of the Specification dealing with the limitation imposed upon the wavelength difference between the two illuminating IR beams.
展开▼
机译:1348979光电反射和透射测量INFRA SYSTEMS Inc 1970年11月5日[1969年11月5日] 34973/73从1348978标题G1A中分出规范1348978描述并要求保护规范中涉及两个照明之间的波长差的限制红外光束。
展开▼