INFRARED TECHNIQUE FOR MEASURING A PARAMETER EG THICKNESS OF A THIN FILM

摘要

1348980 Photoelectric reflection and transmission measurements INFRA SYSTEMS Inc 5 Nov 1970 [5 Nov 1969] 34994/73 Divided out of 1348978 Heading G1A The Specification describes and claims that aspect of the Parent Specification 1348978 in which a limitation is imposed on the wavelength range of each illuminating beam.