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Electron microscope electron beam magnetic deflection system - has two saddle-type coils symmetrical to undeflected electron beam

机译:电子显微镜电子束磁偏转系统-具有两个与未偏转电子束对称的鞍形线圈

摘要

The magnetic deflection system for the electron beam of an electron microscope has two coils in symmetrical arrangement relative to the path of the undeflected electron beam. Each coil has at least two saddle-shaped windings, matching a cylindrical surface. The windings have longitudinal parts parallel to the electron path, which are connected by cross parts describing a circular arc. The windings are mutually offset in the direction of the electron beam. The cross parts, through which current flows in the same direction, are of successively reducing length in the beam path direction, while the long parts are of indentical length. Alternatively the configuration may be such that the cross parts are of successively increasing length.
机译:用于电子显微镜的电子束的磁偏转系统具有相对于未偏转电子束的路径对称布置的两个线圈。每个线圈具有至少两个鞍形绕组,与圆柱表面相匹配。绕组具有平行于电子路径的纵向部分,该纵向部分通过描述圆弧的交叉部分连接。绕组在电子束方向上相互偏移。电流沿相同方向流过的横截面在束路径方向上​​的长度依次减小,而长的部分具有相同的长度。可替代地,该构造可以使得横截面的长度连续增加。

著录项

  • 公开/公告号DE2351448A1

    专利类型

  • 公开/公告日1975-04-24

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19732351448

  • 发明设计人 ANGERKLAUSDIPL.-ING.;

    申请日1973-10-11

  • 分类号H01J29/76;H01J37/26;

  • 国家 DE

  • 入库时间 2022-08-23 03:57:35

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