首页> 外国专利> Contacting semiconductor, esp. integrated circuit - using ribbon with rounded or tapered fingers and avoiding short circuiting on encapsulation

Contacting semiconductor, esp. integrated circuit - using ribbon with rounded or tapered fingers and avoiding short circuiting on encapsulation

机译:接触半导体,尤其是集成电路-使用带圆形或锥形手指的色带,并避免封装短路

摘要

Contacting of semiconductor elements, esp. integrated circuits, with an electrically conductive ribbon with fine structures of individual fingers corresp. to the number of electrical leads is carried out in such a way that short circuits are avoided. The elements are placed in the centre of the ribbon and the leads are taken from the free ends of the fingers to the contact points by thin metal wires. After contacting, the assembly is encapsulated with a drop of plastics (I) by spraying. The novelty comprises the use of ribbon in which the critical edges of the fingers tending to short circuit with the contact wires on spraying are removed, taking the wires to the contacts so that these form a slight arc in the spraying direction and spraying with (I) of low viscosity. Yield stability of electrical parameters and reliability in operation are improved. (I) esp. on epoxy resin.
机译:半导体元件的接触,尤其是带有导电带的集成电路,该导电带具有单个手指的精细结构。以避免短路的方式进行电引线数量的减少。元件放置在带状件的中心,引线由细金属线从指状件的自由端引到接触点。接触后,将组件通过喷涂用一滴塑料(I)封装起来。新颖性包括使用带子,其中去除了在喷涂时趋于与接触导线短路的手指的关键边缘,将导线带到触点上,使它们在喷涂方向上形成轻微的弧度并用(I )低粘度。改善了电参数的产量稳定性和运行可靠性。 (一)特别是在环氧树脂上。

著录项

  • 公开/公告号DE2606949A1

    专利类型

  • 公开/公告日1977-08-25

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19762606949

  • 申请日1976-02-20

  • 分类号H01L23/48;

  • 国家 DE

  • 入库时间 2022-08-23 00:02:17

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