SEMICONDUCTOR INTEGRATED CIRCUIT WITH INTER-TERMINAL SHORT CIRCUIT CONTROL TERMINAL, AND METHOD FOR MEASURING CONTACT RESISTANCE OF THE SEMICONDUCTOR INTEGRATED CIRCUIT AND MEASUREMENT JIG

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit with a small circuit size and a simple configuration and a method for efficiently measuring the contact resistance of the semiconductor integrated circuit and a measurement jig.;SOLUTION: There is provided the semiconductor integrated circuit including: at least one external terminal; a control terminal; and an inter-terminal short circuit control terminal for controlling a switching element, the external terminal being connected to the control terminal via the switching element.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2016,JPO&INPIT