首页> 外国专利> Rod contg. fine silicon crystals - made by chemical vapour deposition and then zone melted to mfr. monocrystalline silicon rod

Rod contg. fine silicon crystals - made by chemical vapour deposition and then zone melted to mfr. monocrystalline silicon rod

机译:Rod contg。精细的硅晶体-通过化学气相沉积制成,然后区域熔融至mfr。单晶硅棒

摘要

Fine silicon crystals are deposited onto a heated substrate. The Si is obtd. from a reaction gas mixt. contg. a halosilane and H2 and flowing through a reactor contg. the substrate. The process commences with a high molar ratio (MR) in the reaction gas, a high gas flow, and an optimum deposition temp. (DT). During the process the MR, gas flow and DT are lowered or raised according to a prescribed program. The process pref. starts using MR of SiHCl3/H2 = 0.5 and optimum DT 1100 degrees C. Gas flow is pref. 3000-15,000 l/h. After 10 minutes deposition, the MR is pref. reduced to 0.2 and, when half the desired Si rod dia. has been reached, the DT s reduced by max. 200 degrees C for one hour, and the gas flow reduced to 1/4 with MR increased to 0.5. The step involving a temp. decrease of max. 200 degrees C and redn. in gas flow may be repeated for max. three times. With conventional prodn. of polycrystalline rods, coarse crystals can occur which cause dislocations during subsequent zone melting of the rods to produce monocrystalline rods, e.g. for semiconductor mfr. This problem is avoided.
机译:细硅晶体沉积在加热的基板上。 Si是钝的。来自反应气体混合物。续卤代硅烷和氢气,并流经反应器(续)。基板。该过程始于反应气体中的高摩尔比(MR),高气体流量和最佳沉积温度。 (DT)。在此过程中,MR,气流和DT根据规定的程序降低或升高。流程偏好。开始使用SiHCl3 / H2的MR = 0.5和最佳DT 1100摄氏度。气流优选。 3000-15,000升/小时沉积10分钟后,MR为首选。减小到0.2,并且当所需的Si杆直径减半时。已达到DT,最大降低。在200摄氏度的温度下放置1个小时,随着MR的增加,气体流量减少到1/4。涉及温度的步骤。最大降低200摄氏度并变红。气体流量最大可重复一次。三次。与常规产品在多晶棒的制造中,可能会出现粗晶,这会在随后的棒熔化区中产生位错,从而产生单晶棒,例如单晶棒。用于半导体制造避免了这个问题。

著录项

  • 公开/公告号DE2727305A1

    专利类型

  • 公开/公告日1979-01-04

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19772727305

  • 发明设计人 KASPERANDREAS;

    申请日1977-06-16

  • 分类号B01J17/32;B01J17/28;C01B33/02;

  • 国家 DE

  • 入库时间 2022-08-22 19:50:14

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