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opto-electronic contactless position detecting of integrated circuits - involves scanning chip scanned in lines, and brightness values are integrated and differences formed
opto-electronic contactless position detecting of integrated circuits - involves scanning chip scanned in lines, and brightness values are integrated and differences formed
The detection is independent from pattern and surface properties, in automatic and is intended for adjustment of automatic wiring machines, and for chip transfer to alloying and glueing machines. The position of the chip is found by scanning in lines over the system straight edge, with the lines parallel or nearly so to the direction of the wanted edge (4, 5). The instantaneous brightness intensity is integrated over the lines and differences between line results formed. Only their polarities are used. The result is weighted, reducing the differences in a coarse area, and intensifying them in smooth areas. A signal is derived for the chip position correction.
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