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Iron-doped indium phosphide semiconductor laser

机译:掺铁磷化铟半导体激光器

摘要

An iron-doped indium phosphide or gallium arsenide semiconductor laser. The semiconductor material is doped when formed by uniformly distributing transition metal ions such as iron throughout the semiconductor. The concentration of the iron ions is from about 1× 10.sup.15 to about 1×10.sup.18 ions per cubic centimeter, but is limited only by the solubility of iron indium phosphide or gallium arsenide. It has been determined that the greater the concentration of ions, the easier the laser emission is obtained. At liquid helium temperature, the iron-doped semiconductor laser will operate at a wavelength near 3 microns.
机译:铁掺杂的磷化铟或砷化镓半导体激光器。当通过在整个半导体中均匀地分布诸如铁的过渡金属离子而形成时,半导体材料被掺杂。铁离子的浓度为每立方厘米约1×10 15至约1×10 18离子,但仅受磷化铟铁或砷化镓的溶解度的限制。已经确定,离子浓度越高,越容易获得激光发射。在液氦温度下,掺铁半导体激光器将在接近3微米的波长下工作。

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