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MEASURING METHOD OF DISTANCE BETWEEN GAP OF MAGNETIC HEADS

机译:磁头间隙距离的测量方法

摘要

PURPOSE:To enable to measure the distance of gap between a plurality of magnetic heads with high accuracy, by diffraction pattern of coherent light. CONSTITUTION:The reference piece 15 having two ridgelines 14 having the gap slightly greater than the gap is located to the magnetic head assembly, the slit 19 is formed among the ridgeline 14 of the reference piece 15 and the ridgeline 18 with the gap opposing surface 16 of magnetic head and the chip side surface 17, and the coherent light, e.g. laser beam 21 is incident to the slit 19 with flat mirrors 22 and 23. On the photodetecting plane of the photodetector arrays 24, 25 located at the position apart from the slit 19 by the size D, the diffraction stripe 26 of 0 order and the diffraction stripe 27 of the 1st order are caused, and the distances X1 and X2 of slit are as expressed in equation I by taking the stripe distances of 0 and the 1st order as d1 and d2 (where; lambda is the wavelength of laser light source and Dd1.d2). Taking the distance of the ridgelines 14 of the reference piece 15 as (a), the gap distance of two megnetic heads is as expressed as equation II, and the distance can be calculated with the stripe distances d1 and d2 measured with the photodetector arrays 24 and 25.
机译:目的:通过相干光的衍射图,能够高精度地测量多个磁头之间的间隙距离。组成:基准件15具有两个脊线14,其间的间隙稍大于间隙,位于磁头组件上,在基准件15的脊线14和脊线18之间形成有缝隙19,缝隙19的间隙相对表面16磁头和芯片侧面17的光和相干光,例如激光束21通过平面镜22和23入射到狭缝19。在光电检测器阵列24、25的光检测平面上,该光电检测器阵列24、25位于与狭缝19相距尺寸D的位置处,0级衍射带26和引起一阶衍射条纹27,狭缝的距离X1和X2如式I所示,通过将0和一阶的条纹距离分别设为d1和d2(其中;λ是激光光源的波长和D d1.d2)。将基准片15的棱线14的距离作为(a),将两个磁头的间隙距离表示为等式II,并且可以利用由光电检测器阵列24测量的条纹距离d1和d2来计算该距离。和25。

著录项

  • 公开/公告号JPS56130817A

    专利类型

  • 公开/公告日1981-10-14

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP19800035021

  • 发明设计人 TOUINJI MASARU;ITOU NOBORU;YOKOYAMA KAZUO;

    申请日1980-03-18

  • 分类号G11B5/455;G11B5/23;G11B5/29;G11B5/48;G11B33/10;

  • 国家 JP

  • 入库时间 2022-08-22 16:59:11

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