首页> 外国专利> Quantitative refractive index inhomogeneity measurement - by measuring deflections of beams passing through different regions of component blanks, for UV visible or IR regions

Quantitative refractive index inhomogeneity measurement - by measuring deflections of beams passing through different regions of component blanks, for UV visible or IR regions

机译:定量折射率不均匀性测量-通过测量穿过组件毛坯不同区域的光束的偏转(对于UV可见或IR区域)

摘要

A method of quantitative measurement of inhomogeneities in refractive indices of optically transparent, plane parallel bodies in the ultraviolet, visible, and infra-red spectral regions is esp. applicable to blanks for manufacture of expensive optical components. It gives precise measurement results, esp. in the infra-red region, with relative economy. A narrow parallel beam is passed through several regions of a plane parallel body. The deflections associated with the individual regions are measured from the intensities at the line image edges. The linear image edges are held linear by suitable arrangement of the aberrations of the optical elements affecting the beam and of the plane of adjustment. The deflection data is evaluated using data processors and represented in quasi-three-dimensional form.
机译:特别是,一种定量测量在紫外,可见和红外光谱区域中的光学透明平面平行体的折射率的不均匀性的方法。适用于制造昂贵光学元件的毛坯。特别是它可以提供精确的测量结果。在相对经济的红外线区域。狭窄的平行光束穿过平面平行体的多个区域。从线图像边缘处的强度来测量与各个区域相关联的偏转。线性图像边缘通过影响光束的光学元件的像差和调整平面的适当布置而保持线性。偏转数据使用数据处理器进行评估,并以准三维形式表示。

著录项

  • 公开/公告号DE3003333A1

    专利类型

  • 公开/公告日1981-08-06

    原文格式PDF

  • 申请/专利权人 OPTISCHE WERKE G. RODENSTOCK;

    申请/专利号DE19803003333

  • 发明设计人 SCHAMBERGERHEINZ;KUTTNERPAULDR.;

    申请日1980-01-30

  • 分类号G01N21/41;

  • 国家 DE

  • 入库时间 2022-08-22 15:12:48

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号