首页> 外国专利> PROCESS FOR FORMING A DEFECT-FREE PHOTOMASK OR REPAIRING DEFECTS IN AN EXISTING PHOTOMASK AND PRODUCT THEREOF

PROCESS FOR FORMING A DEFECT-FREE PHOTOMASK OR REPAIRING DEFECTS IN AN EXISTING PHOTOMASK AND PRODUCT THEREOF

机译:在现有的光掩膜中形成无缺陷的光掩膜或修复缺陷的过程及其产品

摘要

A process for forming a defect-free photomask consisting of an opaque layer overlying a transparent substrate or for repairing transparent defects in an opaque layer (chromium film) overlying a transparent substrate which process comprises applying a coating material (coating material) which absorbs radiant energy to the surface of the substrate, directing a beam of radiant energy (laser) through the substrate onto the coating material at points to be made opaque so as to fuse the coating material and the substrate at their interface thereby forming an opaque layer (treated area) on said substrate, and removing from the surface the unfused coating material (residue).
机译:一种形成由覆盖透明衬底的不透明层组成的无缺陷光掩模或修复覆盖透明衬底的不透明层(铬膜)中的透明缺陷的方法,该方法包括施加吸收辐射能的涂料(涂料)。到衬底的表面上,将辐射能(激光)束穿过衬底,使其在不透明的点上到达涂层材料,从而使涂层材料和衬底在其界面处融合,从而形成不透明的层(处理区域) )在所述基材上,并从表面除去未熔融的涂料(残留物)。

著录项

  • 公开/公告号WO8103628A1

    专利类型

  • 公开/公告日1981-12-24

    原文格式PDF

  • 申请/专利权人 MASTER IMAGES INC;CAMPI J;

    申请/专利号WO1981US00825

  • 发明设计人 CAMPI J;

    申请日1981-06-18

  • 分类号B05D3/06;

  • 国家 WO

  • 入库时间 2022-08-22 13:11:36

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