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Corona charging for testing reliability of insulator-covered semiconductor devices
Corona charging for testing reliability of insulator-covered semiconductor devices
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机译:电晕充电测试绝缘子覆盖的半导体器件的可靠性
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摘要
A method for predicting certain electrical failures in a semiconductor device after long-term operation, includes the steps of measuring a predetermined parameter of the semiconductor device before and after it is exposed to a corona discharge and then comparing the two measurements.
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