首页> 外国专利> Optical imaging system provided with an opto-electronic detection system for determining a deviation between the image plane of the imaging system and a second plane on which an image is to be formed

Optical imaging system provided with an opto-electronic detection system for determining a deviation between the image plane of the imaging system and a second plane on which an image is to be formed

机译:具有光学检测系统的光学成像系统,该光电检测系统用于确定成像系统的像平面和要在其上形成图像的第二平面之间的偏差

摘要

An optical imaging system is described which is provided with an opto- electronic detection system for determining a deviation between the image plane of the imaging system and a second plane on which an image is to be formed by the imaging system. After a first reflection on the second plane an auxiliary beam which is obliquely incident on said plane is reflected along itself and mirror-inverted, is subsequently reflected a second time on the second plane, and is finally incident on two detectors. The difference signal of the detectors, which is a measure of the deviation, is unaffected by tilting of the second plane and by local variations in reflectivity of in said plane.
机译:描述了一种光学成像系统,该光学成像系统配备有光电检测系统,该光电检测系统用于确定成像系统的像平面与要通过成像系统在其上形成图像的第二平面之间的偏差。在第二平面上进行第一次反射后,倾斜入射在该平面上的辅助光束会沿自身反射并镜面反转,随后在第二平面上进行第二次反射,最后入射到两个检测器上。检测器的差信号是偏差的量度,不受第二平面的倾斜和所述平面中反射率的局部变化的影响。

著录项

  • 公开/公告号US4356392A

    专利类型

  • 公开/公告日1982-10-26

    原文格式PDF

  • 申请/专利权人 U.S. PHILIPS CORPORATION;

    申请/专利号US19800158653

  • 发明设计人 STEFAN WITTEKOEK;THEODORUS A. FAHNER;

    申请日1980-06-11

  • 分类号G01J1/20;

  • 国家 US

  • 入库时间 2022-08-22 12:07:58

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