首页> 外国专利> OPTICAL IMAGING SYSTEM PROVIDED WITH AN OPTO-ELECTRONIC DETECTION SYSTEM FOR DETERMINING A DEVIATION BETWEEN THE IMAGE PLANE OF THE IMAGING SYSTEM AND A SECOND PLANE ON WHICH AN IMAGE IS TO BE FORMED

OPTICAL IMAGING SYSTEM PROVIDED WITH AN OPTO-ELECTRONIC DETECTION SYSTEM FOR DETERMINING A DEVIATION BETWEEN THE IMAGE PLANE OF THE IMAGING SYSTEM AND A SECOND PLANE ON WHICH AN IMAGE IS TO BE FORMED

机译:带有光电检测系统的光学成像系统,用于确定成像系统的成像平面和要成像的第二平面之间的偏差

摘要

15.1.80 1 PHN 9487ABSTRACT:Optical imaging system provided with an opto-electronicdetection system for determining a deviation betweenthe image plane of the imaging system and a secondplane on which an image is to be formed.An optical imaging system is described whichis provided with an opto-electronic detection systemfor determining a deviation between the image planeof the imaging system and a second plane on which animage is to be formed by the imaging system. After afirst reflection on the second plane an auxiliarybeam which is obliquely incident on said plane isreflected along itself and mirror-inverted, is sub-sequently reflected a second time on the second plane,and is finally incident on two detectors. The dif-ference signal of the detectors, which is a measureof the said deviation, is independent of a tiltedposition of the second plane and of local differencesin reflection in said plane.
机译:15.1.80 1 PHN 9487抽象:具有光电的光学成像系统确定系统之间的偏差的检测系统成像系统的像平面和第二个要在其上形成图像的平面。描述了一种光学成像系统,该系统配有光电检测系统用于确定图像平面之间的偏差成像系统和第二平面上图像将由成像系统形成。之后辅助平面上的第二反射倾斜入射在所述平面上的光束是沿自身反射并镜像反转,随后在第二平面上进行了第二次反射,最终入射到两个探测器上。差异检测器的参考信号,这是一个量度所述偏差的大小,独立于倾斜第二平面的位置和局部差异在所述平面上的反射。

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