Test system for waveguide arc detector circuits

摘要

A system for testing a wave guide arc detecting circuit (18) for a microwave system is disclosed. Testing is accomplished by utilizing a pulsed laser source (32) to generate pulses of optical energy which are used to simulate an electrical arc across the wave guide (16). The laser source (32) is then positioned such that the pulsed output signal impinges upon the wave guide arc detector circuit (18) to be tested. This is most advantageously accomplished by affixing the wave guide arc detector circuit (18) to the wave guide (16) in a fashion similar to normal operation. This enables the arc detecting circuit (18) to view the end of the wave guide through the interior of the wave guide (18). The laser source (32) is positioned such that the output pulse of the laser source (32) impinges on the open end of the waveguide (16). The operational status of the wave guide arc detecting circuit (18) is determined by measuring the elapsed time between the generation of the output pulse of the laser and the detection of the pulse by the arc detecting circuit (18) being tested.