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Cold/dry substrate treatment technique which improves photolithographic limits of resolution and exposure tolerance

机译:冷/干基片处理技术,可提高光刻技术的分辨率和曝光容限

摘要

A limitation in the use of ceramic substrates for electronic packaging is that photolithographic processes applied to such substrate surfaces do not give the highest resolution that the process is capable of because of inherent surface topographical variations on the ceramic substrate. A smoothing layer of a dry film glazed photosensitive material, such as RISTON solder mask, is laminated over the substrate surface, exposed with UV and cured. Metal conductor lines are then bonded onto the surface of the solder mask layer.
机译:陶瓷基板用于电子封装的局限性在于,由于陶瓷基板上固有的表面形貌变化,应用于这种基板表面的光刻工艺无法提供该工艺所能达到的最高分辨率。将干膜玻璃光敏材料(例如RISTON阻焊膜)的平滑层层压在基材表面上,用UV曝光并固化。然后将金属导体线结合到阻焊层的表面上。

著录项

  • 公开/公告号US4490457A

    专利类型

  • 公开/公告日1984-12-25

    原文格式PDF

  • 申请/专利权人 HONEYWELL INC.;

    申请/专利号US19810332269

  • 发明设计人 VAHRAM S. KARDASHIAN;RICHARD D. BENSON;

    申请日1981-12-18

  • 分类号G03C5/00;

  • 国家 US

  • 入库时间 2022-08-22 07:53:22

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