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Processes for the remote measurement of the emissivity and/or the true temperature of a body with relatively smooth surface

机译:远程测量表面相对光滑的物体的发射率和/或真实温度的过程

摘要

A process for the remote measurement of the emissivity &egr; of a body (1) with relatively smooth surface, consisting: in making, with a detector (6) and a converter (9), a first measurement A of the luminance at a point M on the surface at an emission angle &thgr;, the thermal radiation (2) on which the measurement is made being polarized (at 4) in a first direction with respect to the emission plane, in making a second measurement B of the luminance at the same point and at the same emission angle &thgr;, the thermal radiation being polarized in a second direction, different from the first one, finally, in determining the emissivity ##EQU1## &thgr;.sub.1 being the angle of the axis of the polarizer for A and &thgr;.sub.2 being the angle of the axis of the polarizer for B, measured with respect to a polarization perpendicular to the emission plane.
机译:远程测量发射率的过程。具有相对光滑的表面的物体(1)的结构,包括:用检测器(6)和转换器(9)对在发射角为θ的表面上的点M处的亮度进行第一测量A,在同一点上以相同的发射角&thgr进行亮度的第二次测量B时,对其进行测量的热辐射(2)在相对于发射平面的第一方向上被偏振(在4°)。最后,在确定发射率## EQU1 ##时,热辐射在与第一方向不同的第二方向上偏振。 .2是相对于垂直于发射平面的偏振测量的B偏振器轴的角度。

著录项

  • 公开/公告号US4498765A

    专利类型

  • 公开/公告日1985-02-12

    原文格式PDF

  • 申请/专利权人 UNIVERSITE PARIS X - PARIS;

    申请/专利号US19820391380

  • 发明设计人 PHILIPPE HERVE;

    申请日1982-06-23

  • 分类号G01J5/58;G01J5/32;

  • 国家 US

  • 入库时间 2022-08-22 07:53:07

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