首页> 外国专利> Deposition of doped silicon contg. layers on semiconductor wafers - using low pressure CVD with addn. of oxygen contg. component into reaction gas stream to give uniform doping element rare deposition

Deposition of doped silicon contg. layers on semiconductor wafers - using low pressure CVD with addn. of oxygen contg. component into reaction gas stream to give uniform doping element rare deposition

机译:掺杂硅的沉积续。半导体晶片上的金属层-使用带有Addn的低压CVD。持续的氧气组分进入反应气流中以提供均匀的掺杂元素稀有沉积

摘要

Semiconductor devices are made by heating a number of wafers of semiconductor material in an oven tube, then depositing a doped Si-contg. layer on the wafers by passing a stream of reaction gas through the tube, the reaction gas comprising a carrier gas (I), a hydrogen-contg. Si cpd. (II) and a hydrogen cpd. of a doping element (III), whilst an extra gas (IV) is passed through the oven tube by introducing an oxygen-contg. component into the stream of reaction gas in an amt. such that the doping element is deposited at a rate which does not vary essentially in the direction of flow of the gas stream.
机译:半导体器件是通过在烤箱管中加热许多半导体材料的晶片,然后沉积掺杂的Si-contg制成的。通过使反应气体流通过管而在晶片上形成一层H 2,该反应气体包括载气(I),含氢的气体。 Si cpd。 (II)和氢cpd。掺杂元素(III),然后通过引入氧气将多余的气体(IV)通过烘箱管。进入反应气流中因此,掺杂元素的沉积速率基本上不会在气流的方向上变化。

著录项

  • 公开/公告号NL8401234A

    专利类型

  • 公开/公告日1985-11-18

    原文格式PDF

  • 申请/专利权人 N.V. PHILIPS GLOEILAMPENFABRIEKEN TE EINDHOVEN.;

    申请/专利号NL19840001234

  • 发明设计人

    申请日1984-04-17

  • 分类号H01L21/205;C23C16/24;

  • 国家 NL

  • 入库时间 2022-08-22 07:41:07

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