首页> 外国专利> MEASURING DEVICE FOR SECTIONAL PLATE THICKNESS AND SHAPE OF PLATE MATERIAL

MEASURING DEVICE FOR SECTIONAL PLATE THICKNESS AND SHAPE OF PLATE MATERIAL

机译:平板厚度和平板材料形状的测量装置

摘要

PURPOSE:To measure a sectional shape of a plate material correctly and exactly, by arranging plural radiation detectors in the scanning direction, and shifting and synthesizing in respect of a time or a space, output signals from the radiation detectors by a radiant ray which has a transmitted the plate material. CONSTITUTION:A radiation beam 105 emitted from a radiation source 104 transmits a steel plate 103, and is made incident to plural radiation detectors 106 arranged in the scanning direction. Its output signals are sent to a signal processing circuit 107, are synthesized, and thickness of the steel plate 103 is measured. The radiation source 104 and the radiation detector 106 are scanned by a frame 101, transmission X-rays are detected like a time series, shifted signals are synthesized to one, and on the other hand, a statistical noise is averaged and reduced, and also a unit radiation beam can be made sharp enough, therefore, a sectional shape of the steel plate 103 is measured correctly and exactly.
机译:目的:通过在扫描方向上排列多个辐射探测器,并根据时间或空间进行移位和合成,以正确而准确地测量板材的截面形状,该辐射探测器会通过具有以下特征的射线从辐射探测器输出信号:透射了板材。组成:从辐射源104发射的辐射束105透射钢板103,并入射到沿扫描方向排列的多个辐射检测器106。其输出信号被发送到信号处理电路107,被合成,并且测量钢板103的厚度。放射线源104和放射线检测器106被框架101扫描,像时间序列一样检测透射X射线,将移位后的信号合成为一个,另一方面,对统计噪声进行平均化和降低,并且可以使单位辐射束足够尖锐,因此,可以正确且准确地测量钢板103的截面形状。

著录项

  • 公开/公告号JPS6253043B2

    专利类型

  • 公开/公告日1987-11-09

    原文格式PDF

  • 申请/专利权人 TOKYO SHIBAURA ELECTRIC CO;

    申请/专利号JP19810099353

  • 发明设计人 TSUJII TATSUO;

    申请日1981-06-26

  • 分类号G01B15/02;G01N23/06;

  • 国家 JP

  • 入库时间 2022-08-22 07:23:03

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号