首页> 外国专利> A method of fabricating high performance BiCMOS structures having poly emitters and silicided bases

A method of fabricating high performance BiCMOS structures having poly emitters and silicided bases

机译:一种具有多发射极和硅化基极的高性能BiCMOS结构的制造方法

摘要

A process is disclosed for simultaneously fabricating bipolar and complementary field effect transistors. The process enables distinguishing the bipolar devices from the CMOS devices with a single base mask 108, while requiring only a single additional mask 114 to define the bipolar emitter and MOS gates. The process forms the gate oxide 100 for the MOS devices at an early stage, then protects that oxide with polysilicon 103 during subsequent fabrication steps. Self-aligned metal silicide contacts 137 are separated from undesired regions using sidewall oxidation techniques.
机译:公开了一种用于同时制造双极和互补场效应晶体管的方法。该过程使得能够通过单个基极掩模108将双极型器件与CMOS器件区分开,同时仅需要单个附加的掩模114来限定双极型发射极和MOS栅极。该工艺在早期形成用于MOS器件的栅极氧化物100,然后在随后的制造步骤中用多晶硅103保护该氧化物。使用侧壁氧化技术将自对准金属硅化物触点137与不期望的区域分开。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号