ASSAY METHOD USING THE ATOMIC NUMBER MEDIUM OF PHASES CONTAINING A LIGHT ELEMENT USING A SCANNING MICROSCOPE AND AN IMAGE ANALYZER

摘要

THE INVENTION CONCERNS A PRECISE ASSAY METHOD USING THE QUANTITATIVE DETERMINATION OF THE AVERAGE ATOMIC NUMBER OF PHASES CONTAINING TWO LIGHT ELEMENTS OR A LIGHT ELEMENT ASSOCIATED WITH HEAVY ELEMENTS USING A SCANNING MICROSCOPE ASSOCIATED WITH AN ANALYZER IMAGES OF THE INTENSITY OF BACK-BROADCAST ELECTRONS. /P P THIS METHOD IS APPLICABLE TO THE IDENTIFICATION OF A VERY LARGE NUMBER OF PHASES SUCH AS CARBIDES, NITRIDES, BORURES, OXIDES, ETC ...