首页>
外国专利>
METHOD OF DETERMINATION BASED ON THE DETERMINATION OF THE MEDIUM ATOMIC NUMBER OF PHASES CONTAINING A LIGHT ELEMENT BY INTERMEDIATE OF A SCAN MICROSCOPE AND AN IMAGE ANALYZER
METHOD OF DETERMINATION BASED ON THE DETERMINATION OF THE MEDIUM ATOMIC NUMBER OF PHASES CONTAINING A LIGHT ELEMENT BY INTERMEDIATE OF A SCAN MICROSCOPE AND AN IMAGE ANALYZER
展开▼
机译:基于扫描显微镜和图像分析仪测定含轻元素相的中等原子序数的测定方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention relates to an accurate method of quantitative analysis by the quantitative determination of the mean atomic number of phases containing two light elements or one light element combined with heavy elements using a scanning microscope connected to an image analyser of the intensity of the back-scattered electrons. This method of quantitative analysis by the quantitative determination of the mean atomic number ( &upbar& Z1) with a precision of +/-0.1 unit of an unknown phase present in the plane micrographic section of a sample, containing either two light elements (3/=Z/=11) or at least one heavy element (Z12) and a single light element (3/=Z/=11) using a scanning electron microscope comprising analyser X coupled to an image analyser, the image analyser allowing the local intensity of the back-scattered electrons to be measured by the level of greyness (G) of the corresponding image, this method involving, under given operation conditions: (a) determination of the calibration curve G=f ( &upbar& Z) by means of a known samples, (b) determination of the level of greyness (G1) of the unknown phase under consideration, (c) determination of ( &upbar& Z1) by the equation given in a), (d) determination of the chemical composition by means of the equation &upbar& Z1-g (n1, Zi), n1 being the atomic abundance of the element of atomic under Zi present in the phase under consideration, and wherein the values of G or of G1 are determined by the arithmetic mean of the levels of greyness measured by the image analyser over the entire surface of the unknown phase or phases and/or of the reference sample or samples present in the visualized field. This method can be used for the identification of a very large number of phases such as carbides, nitrides, borides, oxides, etc.
展开▼
机译:本发明涉及一种精确的定量分析方法,其通过使用连接到图像分析仪的扫描显微镜定量测定包含两个轻元素或一个轻元素与重元素结合的相的平均原子序数来确定背散射强度电子。通过定量测定平均原子序数(&upbar&Z1)的方法进行定量分析,该方法的精度为样品的平面显微部分中存在的未知相的+/- 0.1单位,其中包含两个轻元素(3 = Z = 11)或至少一个重元素(Z> 12)和单个轻元素(3 = Z = 11),使用包含耦合到图像分析器X的分析仪X的扫描电子显微镜分析仪允许通过相应图像的灰度(G)来测量背向散射电子的局部强度,该方法涉及在给定的操作条件下:(a)确定校准曲线G = f(&upbar&Z )借助已知样品,(b)确定所考虑的未知相的灰度等级(G1),(c)通过a)中给出的方程式确定(&upbar&Z1),(d)确定化学方程式&upbar&Z1-g(n1,Zi),n1是原子在所考虑的相中存在的Zi之下的原子元素的丰度,其中G或G1的值由图像分析仪在一个或多个未知相的整个表面上测得的灰度级的算术平均值确定和/或存在于可视区域中的一个或多个参考样品。该方法可用于识别非常多的相,例如碳化物,氮化物,硼化物,氧化物等。
展开▼