首页> 外国专利> Film thickness measuring device with signal averaging to compensate for roller eccentricity

Film thickness measuring device with signal averaging to compensate for roller eccentricity

机译:具有信号平均功能以补偿辊偏心的膜厚测量装置

摘要

A film thickness measuring device for measuring the thickness of a film formed on a sheet member conveyed with the rotation of a rotary shaft. The thickness measurement is accomplished based on averaged values for a period of time which is determined according to the rotation speed of the rotary shaft. Consequently, errors due to the eccentricity or uneven surface of the rotary shaft are removed from the measurement values resulting in improving an accuracy of the thickness measurement of the film.
机译:一种膜厚测量装置,用于测量随着旋转轴的旋转而输送的片材上形成的膜的厚度。厚度测量是根据一段时间内的平均值完成的,该时间段是根据旋转轴的转速确定的。因此,从测量值中消除了由于旋转轴的偏心或不平坦表面引起的误差,从而提高了膜的厚度测量的精度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号