首页> 外国专利> IMPROVEMENT OF SURFACE DURING EPITAXIAL GROWTH IN LIQUID EPITAXIAL PROCESS

IMPROVEMENT OF SURFACE DURING EPITAXIAL GROWTH IN LIQUID EPITAXIAL PROCESS

机译:液体表皮过程中表皮生长过程中表面的改善

摘要

PURPOSE:To obtain a thin film having a flat surface without generating a terrace pattern by proceeding a predetermined treatment while heaping vertically many jigs having a specified flatness and contg. semiconductor wafers and dipping the jigs in a melt admixed with a feed material. CONSTITUTION:Circular wafers 1 are contained in carbon jigs 2, and many such jigs are heaped. The whole aggregate of the jigs is housed in a quartz cassette 4, in which a melt 3 contg. a solute is contained. The assembly is enclosed by a heater 5 and heated by the heater. The melt 3 fills the inside of the jigs 2 and also upper surfaces of the wafers 1 contacting with the upper surfaces of the wafers 1. Deposition of a compd. is caused on the wafers since the melt reaches supersaturated state when the temp. of the melt is lowered. The flatness of the rear surface of the jig is preferred to be =1mu, but the flatness of an epitaxial thin film can be regulated to =2mu, if the flatness of the rear surface of the jig is regulated to =about 3mu.
机译:目的:通过进行预定的处理,同时垂直堆放许多具有指定平整度和连续性的夹具,获得具有平坦表面的薄膜而不会产生梯形图案。半导体晶片,然后将夹具浸入与进料混合的熔体中。组成:圆形晶圆1包含在碳夹具2中,并且堆积了许多这样的夹具。夹具的整个集合体被容纳在石英盒4中,在石英盒4中,熔融物3继续。包含溶质。该组件被加热器5包围并且被加热器加热。熔体3填充夹具2的内部,并且还填充与晶片1的上表面接触的晶片1的上表面。由于温度达到一定程度时,熔体达到过饱和状态,所以会在晶片上产生热应力。的熔体降低。夹具的后表面的平坦度优选地≤1μm,但是如果夹具的后表面的平坦度≤3μm,则外延薄膜的平坦度可以≤2μm。 。

著录项

  • 公开/公告号JPH01226790A

    专利类型

  • 公开/公告日1989-09-11

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP19880052234

  • 发明设计人 YOKOTA TETSUKAZU;

    申请日1988-03-04

  • 分类号H01L21/208;C30B19/06;

  • 国家 JP

  • 入库时间 2022-08-22 06:47:23

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