首页>
外国专利>
DOUBLE HETERO JUNCTION TYPE SEMICONDUCTOR LASER DEVICE
DOUBLE HETERO JUNCTION TYPE SEMICONDUCTOR LASER DEVICE
展开▼
机译:双异质结型半导体激光器件
展开▼
页面导航
摘要
著录项
相似文献
摘要
PURPOSE:To reduce lattice mismatching of a p-clad layer and to make it possible to control both of p- and n-clad layers to have lattice mismatching coefficients within + or -0.1%, by deviating the lattice mismatching coefficient of the n-clad layer to the plus side when forming a double hetero structure. CONSTITUTION:In a double hetero junction type semiconductor laser device formed on a GaAs substrate 10 which is provided with an active layer 12 between an n-type and p-type In1-y(Ga1-xAlx)yP(0=x=1, 0=y=1) clad layers 11, 13, the ratio a/a0 of the lattice constant (a) of the n-type clad layer 11 in the vertical direction of the substrate 10 and the lattice constant a0 of the GaAs substrate 10 is set at 1.0005=a/a0=1.001. By forming the lattice mismatching coefficient of the n-type In1-y(Ga1-xAlx)xP clad layer 11 deviated to more than +0.05% in this way, deviation of about 0.1-0.15% to the minus side developed by Zn doping in the growth of the p-clad layer 13 is compensated. The lattice mismatching coefficient can be thereby controlled within + or -0.1% for both of p- and n-quantity clad layers.
展开▼
机译:目的:通过消除n-层的晶格失配系数,减少p-包层的晶格失配并使p-和n-包层的晶格失配系数控制在+或-0.1%之内。形成双异质结构时将覆层覆盖到正极。组成:在GaAs衬底10上形成的双异质结型半导体激光器件中,该器件在n型和p型In1-y(Ga1-xAlx)yP(0 <= x <= 1、0 <= y <= 1)的包层11、13,n型包层11的基板10的上下方向的晶格常数(a)与晶格常数a0的比a / a0将GaAs衬底10设置为1.0005 <= a / a0 <= 1.001。通过以这种方式形成n型In1-y(Ga1-xAlx)xP覆盖层11的晶格失配系数大于+ 0.05%的偏差,相对于由Zn掺杂形成的负侧的偏差约为0.1-0.15%。 p-覆盖层13的生长得到补偿。由此,对于p-和n-数量的包层,晶格失配系数可以被控制在+或-0.1%之内。
展开▼