METHOD AND MEASURING INSTRUMENT FOR LONG TIME RESOLUTION TOTAL REFLECTION SPECTRUM ANALYZING

摘要

PURPOSE:To analyze a opto-physical process nearly the surface of a body to be measured accurately and dynamically by measuring the spectrum of retrieval light when exciting pulse light passed through the surface of the border surface of the body to be measured is not projected and the spectrum of retrieval light when the exciting pulse light is projected. CONSTITUTION:Probe light is made incident on a sample on a sample table from a 45 deg. surface of sapphire and multipath-reflected probe light is inputted to a spectroscope through an optical fiber. The probe light is diffused spectrally, time-resolved, and detected by a photodiode array, whose output is digitized and processed by a computer. Namely, a spectrum at the time of nonexcitation has the original spectrum distribution A of the probe light, but the spectrum at the time of excitation has only the wavelength range of the absorption band of an excitation state, a reaction intermediate, etc., and other wavelength ranges outputted as a spectrum B as they are, so the ratio logA/B of the both is calculated by computer processing. Consequently, useful information regarding the photo-physical process nearby the surface or border surface of the body to be measured is obtained.