首页> 外国专利> Calculation method e.g. for multiple spectrums of total reflection, involves measuring reflection spectrum of object and comparing it with computed model spectrum

Calculation method e.g. for multiple spectrums of total reflection, involves measuring reflection spectrum of object and comparing it with computed model spectrum

机译:计算方法例如对于多个全反射光谱,涉及测量对象的反射光谱并将其与计算的模型光谱进行比较

摘要

The method involves measuring a reflection spectrum of an object and comparing it with a computed model spectrum. The model parameters of the model spectrum are varied, until the measured reflection spectrum agrees with the model spectrum and that a given agreement value is reached. The formula is divided in such a way that the computation of the total reflection of the model spectrum into partial formulas that with computation of further spectra with changed parameters only those partial formulas must again be computed, which have a changed parameter.
机译:该方法包括测量物体的反射光谱并将其与计算出的模型光谱进行比较。改变模型光谱的模型参数,直到测得的反射光谱与模型光谱一致并且达到给定的一致值为止。公式以这样的方式划分:将模型光谱的全反射计算分为部分公式,通过计算具有更改参数的其他光谱,仅必须再次计算具有更改参数的那些部分公式。

著录项

  • 公开/公告号DE102005023737A1

    专利类型

  • 公开/公告日2006-11-30

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS JENA GMBH;

    申请/专利号DE20051023737

  • 发明设计人 HALM CHRISTIAN;

    申请日2005-05-23

  • 分类号G01N21/55;G01N21/27;G01B11/06;G01B11/14;G01B11/24;

  • 国家 DE

  • 入库时间 2022-08-21 20:30:01

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