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Electron beam apparatus for testing infrared detectors in a cryogenically shielded environment
Electron beam apparatus for testing infrared detectors in a cryogenically shielded environment
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机译:电子束设备,用于在低温屏蔽环境中测试红外探测器
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摘要
An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat so that the detector can be tested in an environment substantially free of spurious infrared radiation.
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