首页> 外国专利> DETECTION OF AXIS MISALIGNMENT OF SYNCHROTRON RADIATION LIGHT AND EXPOSING DEVICE

DETECTION OF AXIS MISALIGNMENT OF SYNCHROTRON RADIATION LIGHT AND EXPOSING DEVICE

机译:同步辐射辐射光和曝光设备的轴失准检测

摘要

PURPOSE:To allow the safe and efficient execution of the axis alignment operation of an aligner by detecting an axis misalignment by using visible light the optical axis of which is the same as the optical axis of synchrotron radiation (SR) light. CONSTITUTION:A taking out window 4 takes out the visible light included in the SR light 2, absorbs rays, such as X-rays harmful to the human body, and maintains the vacuum of a beam line 1. The optical axis is so adjusted that the visible light passing a pinhole 5 is reflected by a parallel mirror 9, is again passed through the pinhole 5, is changed 90 in a part of the optical path by a sampling mirror 10 and is detected by a photodetector 11. The reflected light is shielded by the pinhole 5 and the quantity of the light arriving at the detector 11 decreases if the mirror 9 has an inclination with the optical axis. The axis misalignment is exactly corrected if the posture of the aligner 6 is so corrected as to admit the visible light 3 reflected by the mirror 9 into the pinhole 5 and the microadjustment is so executed as to maximize the output of the detector 11.
机译:目的:通过使用可见光来检测轴未对准,从而安全有效地执行对准器的轴对准操作,该可见光的光轴与同步辐射(SR)光的光轴相同。组成:取出窗口4取出SR灯2中包含的可见光,吸收诸如对人体有害的X射线之类的射线,并保持光束1的真空。对光轴进行调整以使穿过针孔5的可见光被平行反射镜9反射,再次穿过针孔5,被采样镜10在光路的一部分中改变90,并被光电探测器11检测到。如果反射镜9相对于光轴倾斜,则被针孔5遮挡,到达检测器11的光量减少。如果对准器6的姿势被校正为允许将由镜子9反射的可见光3入射到针孔5中,并且执行微调整以使检测器11的输出最大化,则精确地校正了轴未对准。

著录项

  • 公开/公告号JPH02300697A

    专利类型

  • 公开/公告日1990-12-12

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19890122438

  • 发明设计人 IWATA JOJI;

    申请日1989-05-15

  • 分类号G01B11/26;G21K5/02;H01L21/027;H01L21/30;H05H13/04;

  • 国家 JP

  • 入库时间 2022-08-22 06:02:28

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